UV-Visible-NIR & Raman Microspectroscopy for Large Samples
Not every sample fits on a microscope stage. The 2030XL PRO™ microspectrometer is engineered around an open, oversized sample stage so that semiconductor wafers, flat panel displays, questioned documents and works of art can be analyzed whole — while still measuring transmission, reflectance, fluorescence, photoluminescence and Raman microspectra™ from areas smaller than a micron across.

The 2030XL PRO™ shares its optical core with CRAIC’s flagship 2030PV PRO™: a spectral range of 200 to 2500 nm, Lightblades™ spectrometer technology, the Scorpii™ Advanced Illumination System and TE-cooled array detectors for low noise and long term stability. Samples are viewed directly with DirecVu™ or imaged with a high resolution UV-visible-NIR digital camera, and the sampling aperture and sample are imaged simultaneously for fast, accurate measurements.
From manual operation to full automation with precision control of sample temperature, the 2030XL PRO™ — driven by Lambdafire™ control and analysis software — is built for the fab line, the failure analysis laboratory and the conservation studio: anywhere microscopic answers must come from large samples.
UV-visible-NIR, Raman and photoluminescence microspectra™ of large samples.
Key Features*
- Microspot analysis of large scale samples
- Spectral range: 200 to 2500 nm
- UV-visible-NIR transmission, reflectance and fluorescence microspectroscopy and imaging
- Raman microspectroscopy
- UV-visible-NIR photoluminescence microspectroscopy and imaging
- Polarization microspectroscopy and imaging in the UV, visible and NIR regions
- Thin film thickness measurements
- Colorimetry of microscopic samples
- Manual or fully automated operation
- Lightblades™ spectrometer technology
- Scorpii™ Advanced Illumination System
- Integrated TE-cooled array detectors for low noise and long term stability
- Precision temperature control of samples
- Calibrated, variable measurement areas even smaller than a micron
- Superior images both with eyepieces and digital imaging
- Lambdafire™ spectroscopy and imaging control and analysis software
- Specialized software modules: statistical analysis, spectral mapping, spectral databasing, image analysis and more
- Easy to use and maintain
- From the experts in microspectroscopy

Cutting edge microspectroscopy of large samples
A fully integrated microspectroscopy platform with a spectral range from the deep UV through the visible and into the near infrared. Featuring Scorpii™, SampleSafe™ and Lightblades™ technologies, the 2030XL PRO™ measures transmission, reflectance, polarization and fluorescence spectra of even sub-micron areas — anywhere on a large sample — rapidly and non-destructively. CRAIC Technologies is also the only recognized source for NIST traceable microspectrometer standards.

Flexible Raman microspectroscopy
Add Raman capability and identify the molecular composition of microscopic regions on large samples non-destructively. Multiple laser wavelengths and both solid state and scanning spectrometers are offered, so the Raman configuration matches your research or quality control task.
High sensitivity emission microspectroscopy & imaging
Measure photoluminescence and fluorescence microspectra™ of microscopic areas on large samples, from the deep UV to the NIR. High sensitivity detectors and optimized optics let even weak emitters be characterized quickly.

Polarization microspectroscopy & imaging
Acquire polarized transmission and reflectance microspectra™ and images in the UV, visible and NIR regions — for birefringent films, liquid crystal panels, mineral sections and fibers.

Spectral Surface Mapping™
Combine automated hardware with Lambdafire™ software to generate 5D maps of film thickness, transmission, reflectance, fluorescence, emission and Raman spectra across a surface — with microscopic spatial resolution, over the full reach of the oversized stage.
Superior image quality from the UV to the NIR
High resolution digital imaging in transmission, reflectance and fluorescence across the UV, visible and NIR — see contamination, subsurface structures and features invisible to a standard color camera, on samples of nearly any size.
Applications
- Semiconductor film thickness
- MEMS devices
- Photovoltaic panels
- Colorimetry of flat panel displays
- Intensity mapping of flat panel displays
- Microspectra™ of questioned documents
- Microspectra™ of art works
- ...or any other large scale samples
CRAIC Technologies provides service and support for its instruments worldwide. CRAIC Technologies service engineers offer instrument repair, maintenance, training and technical support for all aspects of CRAIC Technologies products.
Perfect Vision for Science™
The lit microscope base and the lit octagonal optical head are trademarks of CRAIC Technologies, Inc. CRAIC Technologies, 2030PV™, FLEX™, 508PV™, Apollo™, GeoImage™, rIQ™, Lambdafire™, Lightblades™ and “Perfect Vision for Science” are all trademarks of CRAIC Technologies, Inc. Instrument features offered depend upon instrument configuration. Features listed here may not be present in some configurations.
*Features and specifications depend upon instrument configuration. Specifications subject to change without notice.
UV-visible-NIR microscopes, UV-visible-NIR microspectrometers and Raman microspectrometers are general purpose laboratory instruments. They have not been cleared or approved by the European IVD Directive, the United States Food and Drug Administration or any other agency for diagnostic, clinical or other medical use.