CRAIC Technologies™ has developed non-destructive and non-contact metrology tools for flat panel displays. With microscopic sampling areas, CRAIC microspectrophotometer solutions are used for inspection and quality control of flat panel displays and their components. CRAIC tools are used to monitor everything from mura, color and intensity of pixels, emissions from OLED pixels, film thickness measurements, colorimetric analysis of color masks and more. By utilizing UV-visible-NIR range microspectroscopy, you can use the microspectrophotometer to non-destructively MEASURE the transmittance, emission and reflectance of areas on the micron scale. Using the integral software, you can control automation features on CRAIC microspectrophotometers for large number of repetitive measurements and therefore making it ideal for quality control analysis. This can lead you to develop high resolution maps across the across panels of thickness and colorimetric and intensity variations.
CRAIC microspectrometers are also being used to help develop the next generations of next generation of flat panel displays. CRAIC’s superior technological and scientific expertise allows us to find innovative microspectrophotometer solutions to help you ANALYZE your spectroscopic, colorimetric and film thickness measurement data. We proudly back our products with unmatched service and support.
We invite you to DISCOVER our revolutionary technologies that include a range of microspectrophotometers, UV and NIR microscopes, Raman microspectrometers, Traceable Standards, microspectrophotometer accessories and software. And our film thickness tools. We further invite you to experience our exceptional service and technical support.
