| The Challenge | The Solution | The Paper |
|---|---|---|
| Rapid and accurate metrology of OLED displays for color, intensity and mura |
Microspectral analysis of the displays and their components |
OLED inspection systems |
| Locating protein crystals after formation in solution | A UV microscope equipped to selectively image the protein crystals | Protein crystal micro-imaging |
| Determination of protein crystal purity while still in solution | An ultraviolet microspectrophotometer to locate and spectroscopically identify and analyze the purity of the crystals | Protein crystal identification |
| Measure vitrinite reflectance in coal per ISO 7404 and ASTM D2798 standard methods | A microspectrophotometer with appropriate software, standards and microscope | Vitrinite Coal Measurement System |
| Measuring surface plasmon resonance on the microscopic scale | A UV-visible-NIR microspectrophotometer with high magnification | Surface Plasmon Resonance |
| Rapid and accurate metrology of liquid crystal displays for color, intensity and mura |
Microspectral analysis of the LCD displays and their components |
LCD Quality Control |
| Rapid and non-destructive internal inspection of bonded silicon devices |
NIR microscopy at various wavelengths to find voids, cracks, and more. |
Bonded Wafer Inspection |
Microspectroscopy